期刊文献+

水基Sn-In_2O_3纳米浆体的制备及其分散稳定研究 被引量:2

Preparation of nanosized Sn-In_2O_3 aqueous suspension and study on its dispersion stability
下载PDF
导出
摘要 纳米Sn-In2O3颗粒经表面处理制得稳定分散的水基Sn-In2O3浆体。谢乐公式计算出晶粒的平均粒径为33.7nm,HRTEM谱图观察晶粒粒径约为30~50nm,与谢乐公式计算结果相一致,经粒度分布仪测得浆体中纳米粉体按体积计算的平均粒径为192.5nm,分布宽度为22.5nm。将这些测试结果相比可得制得的浆体中纳米Sn-In2O3基本上以几十个晶粒左右的团聚体分散于水溶液中,Sn-In2O3复合微粒间无明显团聚发生。试验研究了溶液pH值、分散处理时间和分散剂用量等因素对浆体稳定性的影响,由FT-IR分析结果表明,较佳的工艺条件下制得的浆体溶液中,分散剂SDBS对Sn-In2O3颗粒的吸附方式由物理吸附趋于化学吸附,并以多层吸附的形式通过静电作用和空间位阻作用有效防止纳米粒子团聚,制得了稳定分散的水基纳米Sn-In2O3浆体。 Nanosized Sn-In2O3 was surface treated to get aqueous nanosized Sn-In2O3 suspension dispersed stably. The average grain size is about 33.7nm calculated by Scherrer' s equation, Sn-In2O3 are spherical and the size is about 30- 50nm by HRTEM, the average size of nanoparticles dispersing in water is 192.5nm with a narrow distribution width of 22.5nm ,measured by granularity instrument. It's shown that the nanoparticles dispersed in water are in the form of aggregation of a few grains, and the aggregations don't reunite with each other. The effects of pH value of the solution, treatment time, and disperser SDBS content on suspension stability were investigated.The results of FT-IR show that in Sn-In2O3 suspension disperser SDBS absorbed chemically on the nanoparticle surface is multiplayer, which prevent nanoparticles from aggregation due to the strong electrostatic and steric effects.
出处 《粉末冶金技术》 EI CAS CSCD 北大核心 2007年第3期175-180,共6页 Powder Metallurgy Technology
关键词 纳米Sn-In2O3 水基浆体 稳定分散 化学吸附 nanosized Sn-In2O3 aqueous suspension stable dispersion chemical adsorption
  • 相关文献

参考文献4

  • 1Liu J M,Lu P Y,Weng W K.Studies on modifications of ITO surfaces in OLED devices by Taguchi methods.Material Science Engineer B,2001,85:209-211
  • 2Card C P,James K M G,Philip G H.Aqueous Sol-Gel routes to conducting films of indium oxide and indium oxide.Sol-Gel Optics 2000,3943:270-279
  • 3Baia I,Quintela M,Mendes L,et al.Performances exhibited by large area ITO layers produced by R.F.Magnetron sputtering.Thin Solid Films,1999,337:171-175
  • 4陈猛,裴志亮,白雪冬,黄荣芳,闻立时.ITO薄膜的XPS和AES研究[J].材料研究学报,2000,14(2):173-178. 被引量:17

二级参考文献3

  • 1Wu Wenfa,Thin Solid Films,1997年,298卷,221页
  • 2Chiou Bishiou,J Am Ceram Soc,1994年,77卷,1740页
  • 3Fan J C C,J Appl Phys,1977年,48卷,3524页

共引文献16

同被引文献9

引证文献2

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部