基于Reed-Muller模式的组合电路故障定位方法

Fault Localization For Combinational Circuits Based on Reed-Muller

针对组合电路的测试生成算法种类繁多,但对所检测到的故障进行定位的方法却很少的问题,阐明了一种基于Reed-Muller模式的组合电路的故障定位方法.该方法在减少测试开销的同时,不但可以方便检测出电路中的单固定型故障,且可以对故障进行定位.此方法还可应用于其他相关电路的可测性设计中.

There are a lot of test generation algorithms for the combinational circuits, but the methods for fault localization are lack. To research the method for fault localization based on Reed - Muller, This method reduces test disbursement, and it can not only detect single stuck -faults easily, but also define the location of faults. This method can be used to study the testability for another related circuit.