摘要
提出一种可绕Z轴转动的粗糙平板(参考物体)实现相位调制,该方法在不改变电子散斑干涉术(ESPI)或数字散斑干涉术(DSPI)系统装置的情况下,可用于微小离面位移场(例如最大离面位移为λ)的测量。
The phase modulation of digital speckle pattern interferometry (DSPI) is discussed theoretically. The experiments for demonstrating its viability in actural measurements are performed. This method can be used for the measurement of out plane displacement field of tiny and complex deformation.
出处
《光学学报》
EI
CAS
CSCD
北大核心
1997年第6期741-744,共4页
Acta Optica Sinica