摘要
采用反应磁控溅射法在不同条件下制备了TiO2薄膜样品,研究了衬底温度、氧分压、溅射压强等生长条件对薄膜结构特性的影响.得到了反应磁控溅射法制备锐钛矿相TiO2薄膜的最佳沉积条件,并对薄膜的表面形貌进行了测量.
TiO2 films were deposited by reactive magnetron sputtering at different conditions. The influences of the deposition conditions such as substrate temperature, O2 partial pressure and sputtering pressure on the structural properties of the films were studied. The optional process conditions to prepare Anatase TiO2 film was discussed.
出处
《绍兴文理学院学报》
2007年第8期44-46,50,共4页
Journal of Shaoxing University
基金
绍兴市科技局基金项目(20031412004147)
关键词
TIO2薄膜
反应磁控溅射
沉积条件
TiO2 film
reactive magnetron sputtering
deposition conditions