电子系统的电磁脉冲效应及防护

Electromagnetic pulse effects and protection of electronic system

电磁脉冲对电子系统具有很强的干扰和破坏作用。为研究电磁脉冲对电子系统的影响,进行了静电放电电磁脉冲对单片机系统的辐照效应实验。实验表明,单片机系统在静电放电电磁脉冲作用下,会出现多种故障现象。在效应实验基础上,研究了单片机加固技术。

Electromagnetic pulse（EMP） can destroy and interfere the electronic system badly. In order to study the effects of EMP to electronic system, the irradiation experiments of electrostatic discharge electromagnetic pulse （ESD EMP） to the single chip microcomputer （SCM） system are made. The experiments show that a lot of failures would occur when the SCM system is irradiated by ESD EMP. Based on the experiments, the hardening technology is studied.