Paul阱中囚禁的低能Ar^(2+)离子与Ar的电荷转移

Charge transfer between trapped low-energy Ar^(2+) and Ar in a Paul trap

在Paul阱中产生并选择囚禁了单一的Ar2+离子,得到低能Ar2+与Ar的电荷转移速率系数为5.84(0.677)×10-10cm3·s-1及其零氩气压强下的离子衰减速率为0.46 s-1,为下一步进行多电荷离子的亚稳态寿命研究提供了有价值的实验参考数据.

Multiply charged Ar^2＋ ions have been produced and selectively trapped in a Paul ion trap. The charge transfer rate coefficient was measured to be 5.84（0. 677） × 10^-10 cm^3· s^-1 for low-energy Ar^2＋ with Ar and the zero-argon-pressure ion decay rate of our fit result was 0.46 s^- 1. The results provided the useful experimental references for further experiment on lifetime measurement of metastable level.