摘要
目的:探讨Pten基因敲除后对过氧化物酶家族(Peroxiredoxins,Prdxs)水平和活性氧水平的影响。方法:采用Western印迹和化学/荧光发光分析法分别检测了在Pten+/+MEF和Pten-/-MEF细胞中PRDXs的表达和细胞内活性氧水平。结果:Western印迹结果显示,与Pten+/+MEF细胞相比,Pten-/-MEF细胞PRDXⅠ,Ⅱ,Ⅴ,Ⅵ蛋白水平下调,PRDXⅢ不变,PRDXⅣ上调。DCFH探针标记后流式结果显示Pten-/-MEF细胞活性氧荧光值显著高于对照Pten+/+MEF细胞(P<0.05)。结论:Pten基因敲除引起数种PRDXs表达下调,细胞内活性氧水平增高。
Objective: To analyze the effect of Pten gene knock-out on peroxiredoxins(PRDXs) expression and the reactive oxygen species (ROS) levels in cells. Methods: The PRDXs protein level and the ROS levels of control Pten^+/+ MEF cells and Pten^ -/- MEF cells were assessed by Western blot and fluorescence activated cell sorther(FACS) method respectively. Results: Compared with control Pten^ +/+ MEF cells,the protein level of PRDXⅠ,Ⅱ,Ⅴ,Ⅵ was down-regulated,the PRDX Ⅲ level did not change and the PRDX1V level was up-regulated in Pten^ -/- MEF cells. The ROS fluorescence cell number was singnificantly higher in Pten^-/- MEF cells than in Pten^+/+ MEF cells. Conclusion: Pten gene knock-out down-regulates PRDX Ⅰ,Ⅱ,Ⅴ,Ⅵ expression and increases ROS levels in cell.
出处
《军事医学科学院院刊》
CSCD
北大核心
2007年第3期201-203,共3页
Bulletin of the Academy of Military Medical Sciences
基金
国家自然科学基金项目(No.30471946)
北京市自然科学基金项目(No.7052056和5062036)