摘要
通过使用X射线衍射仪(XRD)及扫描电子显微镜(SEM)对光谱分析用的控制样品进行相分析和显微分析,同时对光谱控制样品的取样、组织和结构等方面也进行了研究,以保证光谱分析量值传递的规范、严谨,确保光谱分析的准确性。
The X-ray diffraction is used to analyze the phase of the pig iron and the scan electronic microscope is also used to examine the microstructure of the cast iron. To guarantee the accuracy of the spectrum analysis results, the sampling, microstructure and atomic transmission of the spectrum analysis value correctly are studied.
出处
《理化检验（物理分册）》
CAS
2007年第4期192-193,203,共3页
Physical Testing and Chemical Analysis(Part A:Physical Testing)
关键词
原子发射光谱法
钒钛生铁控制样品
X射线衍射分析
扫描电子显微镜
Analysis of atomic emission spectrometry
Controling sample of vanadium titanium pig iron
X- Ray Diffraction （XRD）
Scan Electronic Microscope （SEM）
