摘要
在X射线源透射式工业计算机断层扫描成像技术(X-TICT)中,X射线透射物质时,发生了Compton光子散射现象,有用信息连同散射光子一起进入探头形成伪影。因此,必须进行散射修正。利用X射线透射物质时X光子散射遵循的Compton散射强度方程,结合X射线与物质相互作用的特性,建立了有效去除X-TICT在复合材料工件检测中光子散射问题造成的图像伪影的散射修正模型。探头的总计数减去散射光子数,即可有效去除X-TICT在复合材料工件检测中散射光子造成的伪影。
In the case of a polychromatic source in X-ray TICT, the phenomenon of Compton photon scattering in material takes place. Scattering photon with useful message getting into detectors leads to false image. The precise accurate models equation of scattering correction about interal composites workpiece in X-ray TICT from Compton scattering intensity equation is deduced for wiping out the false image efficiently, which results from photon scattering. By subtracting the count of scattering photon from the one of each detector, it can wipe off the false image for scattering photon effectively for X-ray TICT in testing composites workpiece.
出处
《无损检测》
北大核心
2007年第4期181-184,共4页
Nondestructive Testing
基金
湖南省教育厅资助科研项目(06C606)
湖南省"十一五"重点建设学科--光学基金资助项目
