酚醛树脂固化度的X射线衍射分析

X-ray Diffraction Analysis of the Curing Degree of Phenolic Resin

发展使用X射线衍射技术对酚醛树脂固化度进行研究，确定了酚醛树脂固化度与X射线散射最大值的关系，得出了利用2θ角来标定树脂团化度的公式。该方法具有快速、无损、灵敏度高的优点，并可适用于各种不同的酚醛树脂。

This paper presents a study of the curing degree of phenolic resin by X-ray diffrac-tion analysis technique. Relationship between the curing degree of phenolic resin and maximum X-ray scattering value has been defined- A formula of the curing degree of phenolic resin, calibrated by scattering angle 20, has been obtained. This method has the advantage of quickness, nonde-struction and hige sensitivity. This method can also be used in other kinds of phenolic resin.