集成光芯片的电光性能测试方法

Electric-optic performance measurement for integrated optic chip

为了提高中低精度光纤陀螺工程化批产过程中的一致性和合格率,降低筛选成本,初步定量研究了铌酸锂集成光芯片的附加损耗、光克尔效应、分光比和偏振效应等重要参数对陀螺性能的影响和优化方法,并提出了电光性能的具体测试方法。通过输入特定方波、锯齿波、方波加阶梯波,可从输出波形上进行直观的判断,并可进一步给出性能优劣的量化指标,能够较为准确地进行芯片筛选,提高工艺水平。此项研究成果对铌酸锂集成光芯片的相关标准进行了补充,不仅可以帮助光纤陀螺的制作单位进行更合理可行的器件筛选,还可以帮助芯片的生产单位完善相应的参数测试工作,提高合格率。

In order to improve the production consistency and qualifying ratio in low- and middle-precision fiber optic gyro, and to reduce filter cost, the paper quantitatively studied the influence of some important parameters（such as light extra loss, Keer Effect, extinction ratio and polarization effect, etc.） of LiNbO3 integrated optic component（IOC） on the gyro＇s performance）. The optimization methods were also studied, and the practical measuring method for electric-optic performance was given. By inputting particular square wave, sawtooth wave and square wave plus ladder wave, direct judgment can be drawn from the output waveform, and qualifying criterion for determining the performance can be acquired to accurately screen the IOC with improved technique. The correlated standard of IOC was complemented using this result, which is helpful for perfecting the screening and parameter testing,