铜表面“多元渗-烧结”层的X射线衍射分析

The X ray Diffraction Analysis of the Multiplex Doping sintering Layer on the Surface of Copper

铜表面“多元渗－烧结”工艺使铜表面获得的梯度材料，具有许多优良性能．本文着重叙述了对该材料进行Ｘ射线衍射分析的试验方法，数据采集及相组成分析．发现铜表面“多元渗－烧结”层有一般扩散层的特点，而且还新发现有织构现象．

The multiplex doping sintering technology on the surface of copper is a very useful kind of new technology which is developed by Wuhan Transportation University.This technology makes the gradient material on the surface of copper with many excellent properties.This paper introduces the experimental methods,data collecting and phase structure analysis about this X ray diffraction analysis experiment.With the analysis result,it not only finds that this material has the features of usual spread layer,but also discovers the texture phenomenon.