摘要
A polarization-maintaining （PM） fiber Mach-Zehnder （MZ） interferometer has been established to measure the EO effect of very thin film materials with optical anisotropy. Unlike a common MZ interferometer, all the components are connected via polarization-maintaining fibers. At the same time, a polarized DFB laser with a maximum power output of 10mW is adopted as the light source to induce a large extinction ratio. Here,we take it to determine the electro-optical coefficients of a very thin superlattice structure with GaAs, KTP, and GaN as comparative samples. The measured EO coefficients show good comparability with the others.
利用保偏光纤MZ干涉仪测量了光学各向异性薄膜材料的电光效应.与传统MZ干涉仪相比,该干涉仪中所有的部件都采用保偏光纤进行连接.光源采用一个偏振输出最大功率为10mW的DFB激光器,用以得到高的信噪比.用该激光器测量超晶格材料的电光系数,同时用GaAs,KTP和GaN材料作为对比材料.测量的电光系数和已有结果有较好的可比性.
基金
国家重点基础研究发展计划(批准号:2006cb302802)
国家自然科学基金(批准号:60336010,90401001)资助项目~~
