碲镉汞光导探测器的变温测试

Measurement of PC MCT Detector with Changing Temperatures

报道了ＨｇＣｄＴｅ光导探测器光电参数随温度变化的关系，重点描述了光谱响应变温测试，给出ＨｇＣｄＴｅ器件从液氮到室温之间若干个不同温度点测试的光谱响应曲线及器件变温测试的性能参数对照表，并与经验公式计算结果进行对比。

The relation between optoelectronic parameter and temperature of PC MCT Detectors,with an emphasis on spectral response changing with temperature,is described.The spectral responses and performances of these devices at several temperatures(from liquid nitrogen temperature to room temperature) are presented.Compared with results of empirical fomula,measurement error analysis is presented.