期刊文献+

液膜法制备STM探针研究 被引量:6

Preparation of STM Tips Using Lamella Drop-off Technique
下载PDF
导出
摘要 本文采用液膜代替传统的电解质溶液,用电化学腐蚀法制备了STM用W探针,细致研究了电压、液膜中电解质浓度和补充滴加电解质的时间间隔的单因素实验和正交实验对探针制备成功率的影响。采用该法得到的探针针尖表面光滑,显示出极好的对称性,在较佳的条件下,曲率半径最小达到48 nm,超过了进口的商业化STM探针的水平,可以进行实际应用。 In this paper, tungsten TM tips were prepared by electrochemical corrosion method using lamella drop-off technique instead of conventional electrolyte solution. Single-factor experiments and orthogonal experiments of the influences of voltage, concentration of electrolyte in the lamella and the electrolyte-refill interval on the rate getting successful STM tips were studied in details. The tips obtained using such method show smooth surface with good symmetrical characteristic, the radius of curvature of the best-prepared tip under a relatively good condition is 48 nm, which exceeds the imported commercial production and could be used for practical application.
出处 《广东化工》 CAS 2007年第7期33-36,共4页 Guangdong Chemical Industry
关键词 STM探针制备 液膜法 电化学腐蚀 STM探针曲率半径 preparation of STM tips lamella drop-off technique electrochemical corrosion radius of curvature of STM tip
  • 相关文献

参考文献7

  • 1Kazinczi R,Szocs E,Kálmán E,et al.Novel methods for preparing EC STM tips[J].Appl.Phys.A,1998,66:S535-S538.
  • 2刘平,姚琲.扫描隧道探针的制备研究[J].现代仪器,2003,39(6):30-32. 被引量:6
  • 3胡小唐,郭育,刘安伟,吉贵军.微探针电化学加工机理及针尖尺寸控制技术[J].化工学报,1995,46(5):557-561. 被引量:8
  • 4Müller A D,Müller F,Hietschold M,et al.Characterization of electrochemically etched tungsten tips for scanning tunneling microscopy[J].Rev.Sci.lnstrum,1999,70(10):3970-3972.
  • 5Kulawik M,Nowicki M,Thielsch G,et al.A double lamellae drop-off etching procedure for tungsten tips attached to tuning fork atomic force microscopy/scanning tunneling microscopy sensors[J].Rev.Sci.Instrum,2003,74(2):1027-1030.
  • 6Cristiano A,Ilaria B,Massimiliano C,et al.Electrochemical preparation of cobalt tips for scanning tunneling microscopy[J].Rev.Sci.Instrum,2002,73(12):4254-4256.
  • 7吴雪梅,杨礼富,甘俊彦,王梦玉,鞠艳.扫描隧道显微镜针尖的电化学腐蚀制备方法[J].苏州大学学报(自然科学版),1997,13(3):47-50. 被引量:14

二级参考文献14

共引文献22

同被引文献35

  • 1郭仪,白春礼.扫描隧道显微镜针尖制备及其影响因素的研究[J].真空科学与技术,1993,13(1):56-64. 被引量:9
  • 2王明环,朱荻,徐惠宇.电化学腐蚀法制备针尖的试验研究[J].传感器技术,2005,24(3):24-26. 被引量:12
  • 3汪洋,巩金龙,朱德彰,王化斌.利用杠杆原理制备用于扫描隧道显微镜的钨针尖[J].核技术,2007,30(3):200-203. 被引量:6
  • 4MULLER A D, MULLER F, HIETSCHOLD M, et al. Characterization of Electrochemically Etched Tungsten Tips for Scanning Tunneling Microscopy [J]. Rev Sci Instrum, 1999(70): 3970-3972.
  • 5SCHMIDT U, RASCH H, FRIES T, et al. Characterization of STM W Tips by FIM with an Organic Image Gas[J]. Surf Sci, 1992, 266: 249-252.
  • 6SONG J P, PRYDS N H. A Development in the Preparation of Sharp Scanning Tunneling Microseopy Tips. Rev Sci Instrum, 1993, 64 (4) : 900- 903.
  • 7IBE J P, BEY P P, B RANDOW JR S L, et al. On the Electrochemical Etching of Tips for Scanning Tunneling Micros copy [J]. Journal of Vacuum Science & Technology A: Vacuum, Surface and Films, 1990, A8(4):3570-3572.
  • 8VASILE M J, GRIGG D A, GRIFFITH J E, et al. Scanning Probe Tips Formed by Focused Ion Beams I-J]. Rev Sci Instrum, 1991, 62(9): 2167-2171.
  • 9PASQUINI A, PICOTTO G B, PISANI M. STM Carbon Nanotube Tips Fabrication for Critical Dimension Measurements [J]. Sens Actuators Aphys, 2005, 123-124: 655-659.
  • 10Binnig G, Rohrer H. Gerber C et al. Phys. Rev. Lett. 1982, 49: 57-61

引证文献6

二级引证文献14

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部