摘要
采用电子电离质谱(EI-MS)研究双(2-乙醇砜基)烷烃三甲基硅基(TMS)衍生物的质谱裂解行为。发现该类化合物的分子离子峰很弱,最大的特征碎片为[M—CH3]+,其次为[M—SO2CH2CH2OSi(CH3)3]+,二者之间未明显呈现其他特征碎片离子。探讨质谱碎片峰的裂解规律,给出该类化合物的质谱裂解特征,为该类化合物的结构确证提供质谱依据。
TMS derivatives of bis(2-hydroxyethylsulfony) alkane were investigated by electron ionization mass spectrometry(EI-MS). The results show that their molecular ion peaks of all above compounds are weak observed in mass spectra, but the fragment ions [M-CH3 ]^+ and [M-SO2 CH2 CH20Si(CH3)3 ]^+ appear with higher abundance ratio. The fragmentation mechanism of the compounds is proposed. The characteristic fragment ion is pointed out to identify the compounds.
出处
《质谱学报》
EI
CAS
CSCD
2007年第3期148-151,共4页
Journal of Chinese Mass Spectrometry Society
关键词
双(2-乙醇砜基)烷烃
电子电离质谱(EI-MS)
裂解机理
bis (2-hydroxyethylsulfony) alkane derivatives
electron ionization mass spectrometry(EI-MS)
fragment mechanism