摘要
随着现代超大规模集成电路设计与制造工艺的快速发展，芯片的测试与验证所需的代价也越来越高。本文给出了SM8260芯片协作能力测试平台设计的方案，可基于该测试平台进行相关功能的验证与性能测试。
Because of the speedy evolution of the VLSI （Very Large Scale Integration）technology and produce craft, the price of testing and verifying an IC（Integrated Circuit）becomes higher. This article given a scheme that used for test the cooperate ability of multi SM8260. The related function and capability tests could be done on this platform.
作者
罗斐
胡小龙
钟华
LUO Fei, HU Xiao-Long, ZHONG Hua （Central South University, Changsha 410075, China）
出处
《电脑知识与技术》
2007年第6期1316-1317,1377,共3页
Computer Knowledge and Technology
