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Cu引线超声键合动态过程有限元模拟 被引量:5

Finite Element Modeling of Dynamic Process of Copper wire Ultrasonic Wedge Bonding
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摘要 引线键合是电子封装中一种重要的芯片互连技术,其中Cu引线的超声键合是目前研究的热点。利用ANSYS有限元软件建立了包括Cu引线、键合劈刀、焊盘以及芯片在内的超声楔焊模型,采用非线性有限元方法研究冲压和超声振动两个阶段的应力场变化,着重探讨超声振动阶段材料塑性变形量的突变,并分析超声功率改变时焊点结构中应力和应变的变化。 Wire bonding is one of the most important technologies for chip interconnection in microelectronic packaging, and currently copper ultrasonic bonding attracts more attention. A finite element model of dynamic process of ultrasonic wedge bonding was established including the Cu wire, the wedge tool, the pad and the Si chip by a commercial finite element code, ANSYS software. The change of the stress field of the wedge bond at the impact stage and the ultrasonic - applied stage was simulated by the non - linear method. The stepping up of the value of plastic - deformation when ultrasonic was applied was discussed. And the change of stress and strain in the bonding structure when the ultrasonic power is changed was analyzed.
出处 《电子工艺技术》 2007年第4期187-190,220,共5页 Electronics Process Technology
基金 哈尔滨工业大学优秀青年教师培养计划资助(项目编号No.HIT.2006-01504489)
关键词 Cu引线 超声键合 有限元模拟 应力场 超声功率 Cu wire Ultrasonic wedge bonding Finite element simulation Stress field Ultrasonic power
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参考文献5

  • 1Dominiek Degryse, Bart Vandevelde,Efic Beyne. Mechanical FEM simulation of bonding process on Cu low - k wafers[ J]. IEEE transactions on components and packaging technologies,2004, 27 ( 4 ) :643 - 650.
  • 2Chang- Lin Yeh,Yi -Shao Lai,Jenq -Dah Wu. Dynamic analysis of wirebonding process on Cu/low - K wafers [ C ]. 2003 electronics packaging technology conference, singapore,2003. 282 - 286.
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