摘要
随着非挥发性存储器件的尺寸持续缩小,SONOS结构存储器件又重新被重视.简单介绍超短栅长SONOS器件和2bit SONOS器件,重点介绍改进氮化硅层和应用high-K材料,来改善SONOS器件性能的研究.认为只要解决high-K材料在非挥发性存储器件中的应用,具有好的发展前景.
Due to scaling down of nonvolatile memory device, SONOS configuration memory is regarded again. Ultrashort SONOS device and two-bit SONOS device are introduced, and the schemes of changing silicon nitride layer and applying high-K material to improve performance of SONOS device are reviewed. Applying high-K material in nonvolatile memory device should be more promising.
出处
《电子器件》
CAS
2007年第4期1211-1215,共5页
Chinese Journal of Electron Devices
基金
上海交通大学青年教师校内科研启动基金
海市科委重大项目资助(03DZ14025)
上海交大青年科研项目基金支助