摘要
本工作涉及浮栅ROM器件AT29C256的γ射线、X射线和反应堆快中子辐照实验测量。测量结果表明,浮栅ROM器件γ射线、X射线和快中子辐照效应是典型的总剂量效应。错误发生存在剂量阈值,开始出错时的错误数及错误地址不确定,错误数随辐照剂量或注量的增大而增加。
γ-ray, X-ray and neutron irradiation effects of floating ROM devices were measured. The measured results show γ-ray, X-ray and neutron irradiation effects of floating ROM devices are total dose effects. There is a dose threshold when error occurs. At the beginning of error occurrence, the error address and data are random, and the data errors number goes up with the increase of dose or fluence.
出处
《原子能科学技术》
EI
CAS
CSCD
北大核心
2007年第4期489-492,共4页
Atomic Energy Science and Technology
