摘要
为了提高大规模集成电路可测性设计(Design For Test,DFT)的故障覆盖率,减少测试时间,通过分析自我测试(Self-Testing Using MISR and Parallel SRSG,STUMPS)方法中的测试机制,找出了其测试效果不理想的原因,提出了改进型的大规模集成电路的测试方法,用C语言编写了故障模拟程序,并且在ISCAS’85标准测试电路上进行了验证。
To improve fault coverage and reduce testing time is the key aims of testing large scale integrated circuit. In this paper, the internal testing mechanism of STUMPS is analyzed and its failure reason is discovered. An improved method for testing LSI circuit is proposed and verified by making fault simulation implemented with C language on ISCAS＇85 Benchmark circuits.
出处
《信息与电子工程》
2007年第4期308-312,共5页
information and electronic engineering
