Ruland法测定合成分子筛结晶度

Determination of Crystallinity of Synthetic Molecular Sieve by Ruland Method

介绍了用X射线衍射方法测量分子筛的绝对结晶度 ,这种方法涉及到由热振动引起的散射扩散和物质结晶部分晶格的不完善性。Ruland法测定分子筛结晶度是从待测分子筛的内部结构出发 ,对衍射数据进行空气散射校正、偏振校正、Compton散射消除和无定形识别等步骤来确定其结晶度。利用标准的散射曲线对康普顿散射进行特殊的吸收校正。

The absolute crystallinity of synthetic molecular sieve was determined by X-ray diffraction The X-ray method involves scattering diffusion caused by thermal vibration and lattice defect in the crystalline of substance The Ruland method determines the absolute crystallinity with correcting the diffraction data by air scattering, polariscope, Compton scattering and non-fixed shape recognition The correction of absorbance of Compton scattering was made by standards cattering curve Several samples were determined by the proposd method