波导测量中介质参量与试样厚度的关系

Relationship of Medium Paramenter with Specimen Thickness in Waveguide Measurement

本文设计了波导测量系统,在稳频、稳幅及电路匹配条件下,对介质参量进行测量。从理论和实验上得出“短路”、开路情况下的反射系数的振幅|г|与试样厚度d/λ的关系曲线。通过误差分析,找出了准确测量介质材料的试样的厚度。

A waveguide measurement system was designoed in this paper, and the medium parameters were measured under the conditions of constant frequency, constant amplitude and circuit match. The relationship of amplitude of reflection coefficient |r| to specimen thieknes d/λ was obtained theoretically and experimentally for open - rireuit and short -rireuit conditions. Through error analysisthe medtimum specimen thickness for accurat measurement of mediun materials was determined.