摘要
针对复杂电子装置及系统的故障诊断和自动测试,传统的测试仪器和自动测试系统已不能满足实际要求,下一代测试系统和综合仪器便应运而生。在设计下一代测试系统和综合仪器的基础上,给出了下一代测试系统的关联多参量的描述方法,以及对自动测试至关重要的同步测试方法。
Traditional test instruments and automatic test systems can＇ t accommodate the diagnostics requirements of modern comprehensive electronic equipment and systems. The next generation test system（NxTest） and synthetic instrument（SI） were emerged, they could meet the challenges abovementioned. Based on the design of the NxTest and Sis, the correlative multi-parameter modeling method for the NxTest and the synchronous test analysis for the automatic testing were represented.
出处
《计算机应用研究》
CSCD
北大核心
2007年第8期116-118,121,共4页
Application Research of Computers
关键词
下一代测试系统
综合仪器
多参量建模
同步测试
next generation test system
synthetic instrument
multi-parameter modeling
synchronous test
