联合三极电阻率测深的λ比值及分辨率

THE APPARENT RESISTIVITY RATIO IN THE COMBINED RESISTIVITY SOUNDING PROFILING AND ITS RESOLUTION

电阻率联合剖面法常用电阻率λ比值曲线来确定低阻体的位置，使用联合三极电阻率测深亦可计算λ比值，并可画出λ比值的拟断面图。对几种常见二维模型用有限元方法进行数值摸拟计算，得到剖面上数个测点的ρＡｓ，ρＢｓ联合三极电阻率测深，然后计算λ比值，结果表明，电阻率测深中λ比值拟断面图在横向和纵向上均有很好的分辨率。

In the combined resistivity profiling, the apparent resistivity ratio (λ) is often applied to locating of conducting inhomegeneites. Also, In the combined resistivity sounding profiling, the apparent resistivity (λ) can be used and can plot the map of isoohmic secton. This paper makes calculating the apparent resistivity sounding curves (ρsA ,ρsB) above the several 2D models by using finite element method and calculating the apparent resistivity ratio (λ). The map of λ isoohmic sections shows a good resolution for conducting inhomegenetes.