导波光学技术在测量“夹心”光学薄膜各向异性方面的应用:不同膜堆结构中同类薄膜特性的比较

The Applications of Guided Wave Technique in the Measurement of Anisotropy of Sandwich Optical Thin Films:Comparison of Optical Constants for Layers in Different Multilayer Structures

本文介绍了应用导波光学技术测量“夹心”光学薄膜的特征参数的方法,并研究了比较简单的结构(由二、三层膜组成),检测到了高折射率薄膜的各向异性。从不同结构的膜系中的同类薄膜的比较中发现了单层膜与膜堆中对应的“夹心”膜之间在折射率和各向异性上的差别。

One method to measure the characteristic parameters of sandwiched thin films by guided wave technique is given in the paper. For the structures up to two or three layesr, the optical anisotropy can be detected. By comparison with a single layer produced in the same conditions, a slight difference of the index and anisotropy has been found.