摘要
针对工艺参数变化的情况,提出一种成品率驱动的时钟偏差安排算法.提出统计时序约束图的概念,利用统计时序分析的结果将时序电路转换为统计时序约束图;将寻找关键环问题转换为最小费用/时间比值环问题,并按比例分配关键环中的时钟偏差的安全余量.实验结果表明,该算法有助于提高集成电路的成品率.
A yield driven clock skew scheduling algorithm is proposed in presence of process variations. Firstly,we present the concept of statistical timing constraint graph and transform a sequential circuit into a statistical timing constraint graph by using the result of statistical timing analysis. Then, the slacks are assigned proportionally in the critical cycles, which are detected iteratively using the algorithm for minimum cost-to-time ratio cycle problem. Experimental results show that the algorithm can help with is improving the yield of integrated circuits.
出处
《计算机辅助设计与图形学学报》
EI
CSCD
北大核心
2007年第9期1172-1177,共6页
Journal of Computer-Aided Design & Computer Graphics
基金
国家自然科学基金(90307017
60676018)
国家"九七三"重点基础研究发展规划项目(2005CB321701)
教育部跨世纪优秀人才培养计划基金
教育部博士点基金(20050246082)
上海市科委重点基础研究项目(04JC14015
05JC14007)
上海应用材料研究与发展基金(0418).
关键词
时钟偏差
统计时序分析
统计时序约束图
成品率
clock skew
statistical timing analysis
statistical timing constraint graph
yield