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三明治式双折射低通滤波器的研制

Design of sandwich based birefringence optical low pass filter
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摘要 为了有效抑制高于CCD或者CMOS传感器的图像采样频率而出现的莫尔条纹,研制了一种二维三明治式双折射低通滤波器(OLPF)。其主要由三片双折射晶体平板构成三明治结构,并在前、后表面分别镀上红外截止膜和增透膜。对所研制的二维水晶光学低通滤波器进行了实验测试,空间频率测试表明对莫尔条纹有良好的抑制效果。结果表明,所研制的低通滤波器具有很高的自洁净性,与后端的CCD或者CMOS传感器匹配良好,对空间高频有较强的抑制作用。 In order to effectively suppresses is higher than the Moire fringe which the CCD or the CMOS sensor picture sampling frequency appears, two-dimensional sandwich based birefringence optical low pass filter (OLPF) is design, fabrication and tested in our laboratory. Our deviceis consists of two birefringence plates and a half wave plate. On the front and back surfaces of the OLPF, antireflection film and infrared cutting film were plated. The test results show that high spatial frequency and Moire fringe are restrained very well. These reveal that our crystal OLPF can match with the CCD or the CMOS sensor and have good restraining high spatial performance.
作者 连华 曹向群
出处 《光学仪器》 2007年第4期42-46,共5页 Optical Instruments
关键词 光学低通滤波器(OLPF) 空间频率 晶体 脉冲响应 optical low pass filter(OLPF) spatial frequency crystal pulse response
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  • 1康辉.映象光学[M].天津:南开大学出版社,1996.498-499.
  • 2赵建林 秦秀香.相干阿贝成象理论的傅里叶算符描述方法[J].西北工业大学学报,1988,6(3):361-365.
  • 3XU Ying ZHAO Jian-lin XIANG Qiang et al.Image processing in numerical reconstruction for lensless Fourier transform holograms.Acta Photonica Sinica(光子学报),.
  • 4Seebacher S,Osten W,J(u)ptner W.Measuring shape and deformation of small objects using digital holography[J].Proc SPIE[C],1998,3479:104-115.
  • 5Kebbel Volker,Hartmann Hans-J(u)rgen,Werner Jrgen P O.Characterization of micro-optics using digital holography[A].Proc SPIE[C],2000,4101:477-487.
  • 6Kebbel Volker,Hartmann Hans-J(u)rgen,Werner Jptner P O.Application of digital holographic microscopy for inspection of micro-optical components[A].Proc SPIE[C],2001,4398:189-198.
  • 7Cuche Etienne, Marquet Pierre, Magistretti Pierre J, etal.Quantitative phase contrast microscopy of loving cells by numerical reconstructioin of digital holograms[A].Proc SPIE[C],1999,3604:84-89.
  • 8Udupa Ganesha,Ngoi B K A,Freddy Goh H C,et al.Defect detection in unpolished Si wafers by digital shearography[J].Meas Sci Technol,2004,15:35-43.
  • 9Gorski W,Kujawinska M,Salbut L.Selection of interferometric methods for silicon microelements testing[A].Proc SPIE[C].1999,3745:307-318.
  • 10XU Lei,PENG Xiao-yuan,MIAO Jian-min,et al.Studies of digital microscopic holography with applications of microstructure testing[J].Appl Opt,2001,40(28):5046-5051.

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