摘要
荧光X射线强度与试样组成之间的定量关系是十分重要的基本公式。自从T.Shiraiwa等所提出的公式被普遍接受以来,张利兴指出文[1]的公式缺少因子(△Ω)/(4π),并且在推导过程中有些地方物理意义含糊不清,他作了适当的修正与改进。因为文[2]已对一、二次荧光作了研究,所以本文仅对三次荧光作深入的探讨。本文推导过程的物理意义鲜明。
In this paper, two mistakes of T.Shiraiwa's formulas are corrected, and a practical formula of tertiary fluorescent X-ray intensity is given. The exact results of computation of the tertiary fluorescent X-ray intensity are obtained by means of Gaus's quadrature formula and automatic quadrature formula.The quantitative results of intensity carried on Ni-Fe, Fe-Cr and Ni-Fe-Cr alloys according to the continuous spect um of the incident X-rays.
出处
《光谱学与光谱分析》
SCIE
EI
CAS
CSCD
北大核心
1990年第2期54-60,48,共8页
Spectroscopy and Spectral Analysis