X荧光分析中基本参数法和理论α系数法的结合——一种可行的实践方法

COMBINATION OF FUNDAMENTAL PARAMETERS METHOD AND THEORETICAL ALPHA COEFFICIENT METHOD AS APPLIED IN XRF ANALYSIS——A FEASIBLE METHOD IN PRACTICE

一、概述在X荧光分析实践中,基本参数法和理论α系数法各有优缺点。前者完全基于从严格理论推导的X荧光强度公式,当样品和标样的组成相差较大时一般仍能给出较好的结果。其缺点是运算周期长,分析效率较低,特别是当标样和样品组成相差较大时,把相对强度作为浓度初值与真值相差甚远。

Lachance comprehensive alpha coefficient method has been combined with FP method following the idea proposed by R.M.Rousseau. The logic of the relevant computer program developed by the author is detailed in a flow chart diagram. A comparative study shows that when sample differs significantly from standards in their compositions greatest bias of the results occurs in the case of conventional theoretical alpha coefficient method as clearly contrasted to FP method and the combination of the two methods which still yield reasonably good results. Results of several extreme cases are tabulated and a discussion on this respect is provided.