X射线荧光光谱分析中理论α系数的快速计算

CALCULATION OF THEORETICAL ALPHA COEFFICIENTS FOR X-RAY FLUORESCENCE ANALYSIS

在X射线荧光光谱分析中,采用理论α系数对基体效应进行校正已被人们所重视,因其具有所需标样少、分析范围广、通用性强、手续简便等优点。笔者先假设若干组二元体系用NLRXRF程序计算理论相对强度,再由Lachance-Traill模式求得基本α系数,进而推算混合α系数和修正α系数。本文对地质岩石样品中硅酸盐系列的理论α系数作了计算,取得了满意的结果。一。

In this paper, the development application of NRLXRF program was studied. This program which has the function of calculating the X-ray theoretical relative intensity of samples of which all the components are known. Frist, we calculated the Xray theoretical relative intensity of the components given (binary system), then, we calculated Basic alpha coefficients by using the formulas derived from Lachance Traill model. In this paper the theoretical alpha coefficients (Basic, Hybrid and Modified) for rock silicates of geological materials are given and the results are satisfactory.