摘要
用溶胶-凝胶法制备了Ca2Gd8(SiO4)6O2:Tb3+薄膜,用X射线衍射(XRD)、原子力显微镜(AFM)、扫描电子显微镜(SEM)和荧光光谱仪对所得发光薄膜进行了表征。XRD的结果表明薄膜在1000℃完全结晶,并且与标准卡片符合得很好。AFM和SEM的结果表明薄膜表面均匀,没有裂痕,粒子排列紧密,平均直径为90nm,薄膜的厚度为1.3μm。当用233nm激发时,Tb3+的发射光谱由蓝光发射和绿光发射两部分组成,前者对应5D3-7FJ(J=6,5,4,其峰值分别位于376,418,440nm);后者对应5D4-7F(JJ=6,5,4,3,其峰值分别位于490,544,587,623nm)。在Ca2Gd8(SiO4)6O2薄膜基质中,Tb3+的最佳掺杂浓度为Gd3+的9mol%。
Ca2Gd8(SiO4)6O2:Tb^3+ films have been prepared through the sol-gel process. X-ray diffraction (XRD), AFM, scanning electron microscopy (SEM) and fluorescence spectrometer were used to characterize the resulting films. The results of XRD indicated that the films crystallized completely at 1000℃ and agreed well with the standard PDF card. SEM and AFM study revealed that the film had homogeneous surface and no cracks with the thickness of 1.3 μm, and the grains arranged tightly with the average size 90 nm. In Ca2Gd8(1-x)Tb8x(SiO4)6O2 films, excitation into the 4f^8-4f^7 5d band at 233 nm yields the characteristic blue and green emission lines of Tb^3+ ^5D3,4-^7FJ (J=3,4,5,6) transitions, with the ^5D4-^7F5 (545 nm) green emission as the most prominent group. The optimum doping concentration of Tb^3+ is 9 mol% of that of Gd^3+ in the Ca2Gd8(SiO4)6O2 films
出处
《稀有金属材料与工程》
SCIE
EI
CAS
CSCD
北大核心
2007年第A01期866-868,共3页
Rare Metal Materials and Engineering
基金
国家自然科学基金杰出青年学者(50225205)
河北省科学计划与指导项目(04213807)