摘要
提出了５Ｆ软Ｘ光胶片对低能Ｘ射结响应的数学模型，模型中部份参数由厂家提供，其余参数由在１８３ｅＶ和９３３ｅＶ两能点实验标定的胶片响应曲线确定。
A mathematical model was introduced to determine the optical density of film 5F as a function of low energy X ray exposure and its wavelength. Parameters in the model were determined by experimental response curves for film 5F at energy of 183 eV and 933 eV. Validity of the model and its parameters were checked by experimental response curve at energy of 288 eV.
出处
《光学学报》
EI
CAS
CSCD
北大核心
1997年第5期599-603,共5页
Acta Optica Sinica
关键词
软X光
响应曲线
X光胶片
X射线曝光量
film 5F, response curve, mathematical model, optical desity, X ray exposure.
