摘要
针对红外成像系统在条纹噪声和非均匀性噪声干扰下盲元检测精度差的问题,提出了一种将小波滤波和"3σ"原则相结合的盲元检测新方法。首先用小波变换对含有条纹噪声和非均匀性噪声的图像进行预处理,再用"3σ"原则对其进行盲元检测。仿真结果表明该方法消除了噪声对盲元检测的影响,有效地解决了"3σ"原则检测精度低的问题。
Aiming for solving the problem of the bad pixels detection precision of infrared system, a new detection method is proposed , which combine ＂3σ＂ principle with wavelet filtering. This method pretreats the noise image with wavelet transform firstly, then detects bad pixels with ＂3σ＂ principle. Simulation results show that the influence of noise for bad pixel detection has been eliminated and the low detection precision of ＂3σ＂ principle has been improved effectively.
出处
《红外与激光工程》
EI
CSCD
北大核心
2007年第4期453-456,共4页
Infrared and Laser Engineering
基金
国家自然科学基金资助项目(60575013)
航天科技创新基金资助项目(N4CH008)
武器装备预研基金资助项目(514010204HK0334)
