摘要
采用低温荧光激发光谱(PLE)研究了GaAs/AlGaAs多量子阱结构中热电子的弛豫过程,在PLE谱中首次观察到GaAs/AlGaAs多量子阱中LO声子的发射.用四能带Kane模型计算了由轻、重空穴杂化效应引起的价带结构的畸变及其对声子发射谱的影响.实验和理论计算结果均表明,光激发热电子可以通过发射LO声子直接弛豫到激子态上。
Hot electron relaxations in GaAs/AlGaAs multiple quantum wells were studied using photoluminescence excitation (PLE) spectroscopy. LO phonon emissions in the quantum wells were observed. A four band Kane model was built to calculate the deformation of sub valence bands due to the mixing effect of heavy and light hole bands. The deformation affects the measured PLE responses. The measured and calculated results show that photo excited electrons can cascade down to the exciton energy state directly by LO phonon emissions.
出处
《红外与毫米波学报》
SCIE
EI
CAS
CSCD
北大核心
1997年第2期97-101,共5页
Journal of Infrared and Millimeter Waves
基金
国家自然科学基金
关键词
多量子阱
激发光谱
热电子
砷化镓
multiple quantum well, excitation spectrum, hot electrons, phonon scattering.