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红外焦平面失效现象仿真研究

Simulation Study of Infrared Focal Plane Arrays Invalidation Phenomenon
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摘要 在性能较差的红外焦平面器件中,其背景图像经常出现一些现象,比如"黑线"、"锯齿"、"滴落圆"等,其原因可能是红外焦平面器件有缺陷或其读出电路存在问题。本文针对红外焦平面可能出现的各种缺陷,将其等效为失效性模型,用EDA软件分别对采用D I和CTIA两种读出结构的红外焦平面进行失效性等效模拟分析。通过对3×3和10×10规模的红外焦平面输出信号进行模拟,分析了背景图像中失效现象产生的原因。红外焦平面失效现象模拟分析得出的结果,为红外焦平面读出电路结构的改进提供了参考依据。 The background pictures of many infrared focal plane arrays which are poor in capability, often come forth some invalidated phenomena which are just like "black line", "sawtooth", "blob round" and etc. The reason may be that the infrared detector has some defects or the readout circuit exist some problems. The problems which may exist in the IRFPAs are equal to invalidated model. Then with the EDA software, this work simulated the invalidated IRFPA which is using DI and CTIA readout mode. By simulating and emulating the signals of the IRFPAs which is 3 × 3 and 10 × 10, this work analyzed the reasons of invalidated phenomena in the background pictures. The results of simulating the signals of the invalidated IRFPAs, give the referenced gist for improving the IRFPAs readout circuit.
出处 《激光与红外》 CAS CSCD 北大核心 2007年第B09期1005-1009,共5页 Laser & Infrared
关键词 红外焦平面 读出电路 失效性 模拟 IRFPA readout circuit invalidation simulation
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