摘要
研究了(55–x)ZnO-xB2O3-35P2O5-10RnOm(x=0,10,20,30,40)(Zn-B-P)低熔点电子玻璃的性能和结构,分析了B2O3含量的变化对玻璃的线性热膨胀系数(α)、玻璃转变温度(tg)、化学稳定性(w)及密度(ρ)的影响。通过XRD和SEM研究了玻璃的结构。结果表明,B2O3含量在上述范围内变化时,α从83.5×10–7/K变到74.8×10–7/K,tg从350℃变到468℃,ρ从3.21变到2.61。
Properties and structure of the low-melt electronic glass of (55-x)ZnO- xB2O3-35P2O5-10RnOm (x = 0, 10, 20, 30, 40) (Zn-B-P) were studied. Analyzed were the changes of B2O3 contents to the effect of the thermal expansion coefficient (α), glass transformation temperature (tg), etc. Changes of structure of the glass were studied by XRD and SEM. The results indicate that B2O3 contents change in above regime, the α, tg and ρ are changed from 83.5×10^-7to 74.8×10^-7K^-1, from 350 to 468 ℃ and ρ from 3.21 to 2.61, respectively.
出处
《电子元件与材料》
CAS
CSCD
北大核心
2007年第9期65-67,共3页
Electronic Components And Materials
关键词
无机非金属材料
低熔点电子玻璃
磷酸盐玻璃
无铅玻璃
non-metallic inorganic material
low-melt electronic glass
phosphate glass
free-lead glass