摘要
气溶胶样品中Z>12以上元素含量的质子荧光(PIXE)分析是北京师范大学GIC4117串列加速器的主要应用领域之一。为弥补PIXE无法分析H、C、N和O等轻元素之不足,在PIXE靶室160°散射角安装金硅面垒探测器,用质子非卢瑟福背散射分析(PNBS)方法对核孔膜采集的气溶胶样品中H、C、N和O等轻元素的含量进行测量。测量得到的气溶胶样品中H和Si元素含量与质子前角散射(PESA)和PIXE的分析结果相近,表明PNBS可用于核孔膜采集的气溶胶样品的分析。
Particle induced X-ray emission(PIXE) analysis of aerosol samples for measuring concentrations of elements with Z〉12 is one of major applications at the GIC4117 Tandetron at Beijing Normal University. In order to measure H, C, N and O concentrations in aerosol samples, proton non-Rutherford backscattering spectrometry (PNBS) was employed with an Au(Si) surface barrier detector at an angle of 160° in PIXE chamber. PNBS spectra of 4 aerosol samples collected on nuclepore filters were fitted with SIMNRA. H and Si concentrations are comparable with those of proton elastic scattering analysis(PESA) and PIXE, which indicates that PNBS can be used for the analysis of aerosol samples collected on nuclepore filters.
出处
《原子能科学技术》
EI
CAS
CSCD
北大核心
2007年第5期628-632,共5页
Atomic Energy Science and Technology
基金
国家自然科学基金资助项目(10275006)
关键词
质子
非卢瑟福背散射
气溶胶
H
C
N和O含量
proton
non-Rutherford backscattering
aerosol
H,C, N and O concentration