浅谈CMOS集成电路的I_(DDQ)测试

Shallow to Talk About I_(DDQ) of CMOS Integrated Circuit Test

介绍了IDDQ测试的基本原理和主要测试方法,CMOS IC本质上是电流可测试的,IDDQ测试可有效地提高产品质量,降低芯片生产价格,并且它对失效响应分析(FEA)是非常有用的。

This paper has introduced the major test method in IDDQ test and the basic principle of IDDQ test. In substance CMOS IC current can be tested, IDDQ test can availably improve IC quality, Depress CMOS chip＇s cost price,And very helpful on the failed analysis.