摘要
介绍了一种测量波片厚度的新方法.根据偏振光干涉的理论分析,推导出了计算波片厚度的解析式.在此基础上,设计、建立了一套双光路对比测试光强的实验系统.利用该实验系统对含有待测石英薄片的光路进行多次测量,将实验数据用推导出的波片厚度计算公式处理,得到了待测薄片的厚度.
A new method to measurement the thickness of wave plate is introduced. According to the interference theory of polarized light, the formula of wave plate thickness are deduced. Basing on this, an experimental measurement system with double beam path is designed and established. The quartz wave plate for several times with this system is measured. Using the experiment result and theoretical formula, the thickness of the wave plate is figured out .
出处
《曲阜师范大学学报（自然科学版）》
CAS
2007年第4期63-64,72,共3页
Journal of Qufu Normal University(Natural Science)
关键词
波片
线偏振光
延迟量
厚度
wave plate
linearly polarized light
retardation
thickness
