期刊文献+

用云纹干涉法研究金属焊点的热变形问题 被引量:3

Experimental Study on Thermal Strains in Bimetal Joint by Moire Interferometry
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摘要 本文采用现代光测力学的云纹干涉法,对铜-可伐焊接件热应变问题进行了实验研究,确定了焊层的热应变特征,结果表明:由于热膨胀系数不匹配、焊层存在复杂的应力状态,它不仅受到焊板材料对它的剪切作用,而且受到纵向拉伸、挤压作用。 The thermal strain of bimetal soldering joint (Cu and Kovar) is analysed with moire interferometry method. The thermal strain distribution along the soft solder (62Sn 36Pb 2Ag) is determined. It is shown from the results that there exists in the solder layer a complicated state of thermal strain. This is important for understanding the thermal fatigue failure mechanism in electronic package.
出处 《实验力学》 CSCD 北大核心 1997年第2期241-247,共7页 Journal of Experimental Mechanics
关键词 云纹干涉 焊接 热膨胀 热变形 moire interferometry, thermal expassion, solder joint.
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参考文献2

  • 1李云卿,清华大学学报,1993年
  • 2戴福隆,现代光测力学,1990年

同被引文献16

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  • 2唐新成,赖曾美.焊接接头残余应力分析[J].机械强度,1996,18(2):52-55. 被引量:2
  • 3Rao R Tummala.Foundamentals of Microsystems Packaging[M].McGraw Hill international edition,2001.
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  • 5Fei Su,Yaofeng Sun,Cheng Yun Audrey Wong,et al.Development of an Integrated Optical System for Warpage and Hermitage Test of Microdisplay[J].Optics and Lasers in Engineering,2007,45 (12):798-803.
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  • 7Su Fei.An optical technique to characterize hygroscopic expansion and its effects on plastic Packages[J].Microelectronics Reliability,2006,46:600-609.
  • 8Su Fei,Cherm Sin Chian,Dai Fulong.Development and instrumentation of an integrated three-dimensional optical testing system for application in integrated circuit packaging[J].Review of Scientific Instrument,2005,76(9).
  • 9Van Driel W D,Zhang G Q,Jassen J H J,et al.Prediction and Verification of Process Induced Warpage of Electronic Packages[J].Microelectronics and Reliability,2003,43(5):65-774.
  • 10李春植,戴瑞玲,王玮.粘接点焊单搭接头的静力分析[J].机械强度,1997,19(2):21-24. 被引量:5

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