摘要
介绍了４∶１砷化镓高速数据选择器（ＭＵＸ）的测试原理和测试系统的组建，提出测试过程中需要解决的几个问题。
The paper describes the testing principle andthe composition of the testing system for 4∶1 GaAs high speed multiplexer, presents several problems remaining to be solved in testing process.With this testing system,the maximum operating frequency of 800MHz is obtained.
出处
《半导体情报》
1997年第3期38-40,56,共4页
Semiconductor Information
