摘要
介绍了一种可用于电光采样系统的微波扫描移相器，其线性度≤１．４％，插入损耗≤４．０５ｄＢ。用此移相器组成的电光采样测试系统测量了高速门电路波形。
A microwave scanning phase shifter for electro optic sampling systems has been developed, which has the linearity less than ±1.4% and insertion loss less than 4.05 dB. The electro optic sampling system based on the phase shifter has been used to measure the waveform of a high speed gate circuit. The method for sweep interval scaling is discussed.
出处
《微电子学》
CAS
CSCD
北大核心
1997年第2期130-132,共3页
Microelectronics
关键词
电光采样
移相器
微波扫描
集成电路
测试
Electro optic sampling, Phase shifter, Microwave scanning, IC test
