Cr_2Ta中层错的Z衬度像研究

Z-contrast imaging investigation of stacking faults in Cr_2Ta Laves phase

本文利用高角环形暗场成像技术获得六角Cr2Ta Laves相的重原子分辨的原子序数(Z)衬度像,阐述了在相近分辨率情况下Z衬度成像技术与普通高分辨像相比具有一定优势。从所得到Cr2Ta的层错的Z衬度像,直观地解释了层错的原子排列构型,为理解复杂结构中缺陷的原子构型提供了资料。

Atomic projection of hexagonal Cr_2Ta Laves phase has been directly imaged by Z-contrast imaging at an atomic scale,which provides much more detailed information compared with the conventional coherent high-resolution imaging.Stacking faults with sequence of …stst＇st＇stst＇… were identified,where the three-layer stacks（Ta-Cr-Ta）switch from t to t＇ type.The defect configuration at an atomic level in the present study is expected to provide useful information for understanding defect structures in the Laves phase.