摘要
本文介绍了一种可定位拾取并重新放置单个纳米颗粒的方法。这种技术被命名为"单颗粒纳米蘸笔技术"。它采用原子力显微镜针尖作"笔",俘获基底表面的单个纳米金颗粒,并将之精确定位地转移到其它基底表面。
Single gold nanoparticles deposited on the solid substrates have been captured and re-deposited by using a novel technique termed as single particle dip-pen nanolithography(SP-DPN).The SP-DPN employs an atomic force microscope(AFM)tip as a "pen",which is inked with gold nanoparticles in a one-by-one fashion.Nanoparticles adhered to the AFM tips can be controllably released and re-deposited on another surface.This method is opening opportunities for direct applications in single-electron electronics and nanofabrication of nanoelectromechanical system.
出处
《电子显微学报》
CAS
CSCD
2007年第5期484-487,共4页
Journal of Chinese Electron Microscopy Society
基金
国家自然科学基金资助项目(No.10335070
No.10404032
No.10675160
No.30470441)
上海市纳米专项基金(No.0552NM033).
关键词
原子力显微镜
纳米颗粒
单颗粒纳米蘸笔技术
atomic force microscope
nanoparticle
single particle dip-pen nanolithography