摘要
Overview This guideis collection of whitepapers designed to help you develop test systems that lower your cost ,
Overview
This guide is collection of whitepapers designed to help you develop test systems that lower your cost, increase your test throughput, and can scale with future requirements. This whitepaper provides strategies for maximizing system throughput. To download the complete developers guide （120 pages）, visit ni. com/automatedtest.
出处
《国外电子测量技术》
2007年第9期1-5,共5页
Foreign Electronic Measurement Technology
