一种新型内建自测试重播种技术

New Reseeding Method for Built-in-self Test

测试数据压缩是SoC(System on a Chip)测试领域研究的一个热点问题.本文提出一种新型的内建自测试重播种技术,这项技术利用一个LFSR(Linear Feedback Shift Register)的种子对多个确定性测试向量进行编码压缩,能够显著提高测试数据的压缩率.在ISCAS89基准电路上进行的实验数据显示,这项技术可以减少约30%的LFSR种子数量,进而降低了测试成本.

Test data compression is a hot issue in SoC （System on a Chip） testing industry. This paper presents a new BIST reseeding method which can significantly improve the ratio of test data compression using one LFSR （Linear Feedback Shift Register） seed to encode multiple deterministic test patterns. The experimental results on the ISCAS89 benchmark circuits show that this method has about 30% reduction of the seed number and can decrease test cost.