自动测试系统中探笔快速定位技术研究

The rapid location technique of probes in automatic test systems

随着被测对象的复杂程度不断提高,在自动测试系统中用探笔定位元器件位置变得非常困难。通过探笔快速定位技术的研究,可以在电路板的自动测试过程中利用UUT实物图形来进行探测引导,能够实现快速准确地标定探测点或者故障器件在电路板上的位置,大大提高测试速度,降低误操作率,提高电路板自动测试系统的故障诊断效率。

With tested systems getting more and more complicated, to locate the components of an unit under test （UUT） with a probe is becoming more and more difficult. A real picture of an UUT can be used to guide component position fixing, so as to accurately locate fault components on circuit boards. Application proved that such method can achieve higher test speed and lower rate of mis - operation, and hence the efficiency of fault diagnosis can be increased.