硫醇自组装膜在金表面吸附行为的AFM力曲线研究

Study on adsorption behavior of thiol self-assembled monolayer on gold surface by AFM force curves

本文用原子力显微镜(AFM)对硫醇自组装金电极表面随机取点测得力曲线,并对力曲线粘附力数据进行统计分析,结果表明随自组装液中硫醇浓度改变,粘附力特征呈脱出关联性的变化。力曲线所揭示的自组装膜吸附行为的变化规律和传统电化学方法交流阻抗(EIS)测试所得结论一致,表明AFM力曲线技术可应用于自组膜吸附行为的研究。

Atomic force microscopy （AFM） was used to measure the force curves at random positions on the thiol-assembled gold surface, and the statistical analysis of the adhesive force values shows that the self-assembled layers obtained at different thiol concentrations present different adhesive force characteristics. The changing rule revealed by force curves is in good agreement with the result of EIS （electrochemical impedance spectroscopy）, which indicates that AFM force curve technology is a successful way to investigate the adsorption behavior of self-assembled monolayer.