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Bi_(4-x)La_xTi_3O_(12)铁电薄膜结构和光学性能研究 被引量:2

STRUCTURAL AND OPTICAL PROPERTIES OF Bi_(4-x)La_xTi_3O_(12) THIN FILMS
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摘要 用化学溶液沉积法分别在Si(100)和石英玻璃衬底上成功制备了一系列Bi4-xLaxTi3O12(BLT)铁电薄膜;用X-射线衍射仪测量了不同退火温度和不同掺镧量的BLT薄膜的结晶情况,结果显示随着退火温度的升高BLT薄膜结晶越来越好,镧的掺入并不改变钛酸铋薄膜的钙钛矿结构;用椭偏光谱仪对不同退火温度的BLT薄膜进行了椭偏光谱测量,分析得到了薄膜的光学常数谱;用激光显微拉曼光谱仪对不同掺镧量的BLT薄膜进行激光拉曼谱测量,得到了BLT薄膜振动模式随掺镧量的变化. Lanthanum-substituted bismuth titanate(BLT) thin films were deposited on Si (100) substrates and on quartz substrates by using the chemical solution deposition method. The crystallinity of BLT thin films was examined by X-ray diffraction (XRD). X-ray diffraction analyses show that the BLT thin films are polycrystalline and the crystalline quality of the films is improved with the increasing of annealing temperature. The optical properties of the BET thin films were investigated by using a spectroscopic ellipsometry. The optical constant spectra (refractive index n and the extinction coefficient k) of the BLT thin films were obtained. Laser micro-Raman spectrometer was used to study the lattice vibration modes of the BLT thin films deposited on quartz substrates.
出处 《红外与毫米波学报》 SCIE EI CAS CSCD 北大核心 2007年第5期332-335,共4页 Journal of Infrared and Millimeter Waves
基金 国家自然基金(50372085) 广东省科技计划项目(2004B60303001 2006A1100100)
关键词 铁电薄膜 椭偏光谱 拉曼光谱 BLT薄膜 ferroelectric films spectroscopic ellipsometry Raman spectroscopy bismuth lanthanum titanate thin film
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同被引文献23

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